Trait DebugEraseSequence

pub trait DebugEraseSequence: Send + Sync {
    // Provided method
    fn erase_all(
        &self,
        _interface: &mut dyn ArmProbeInterface,
    ) -> Result<(), ArmError> { ... }
}

Chip-Erase Handling via the Device’s Debug Interface

Provided Methods

fn erase_all( &self, _interface: &mut dyn ArmProbeInterface, ) -> Result<(), ArmError>

Perform Chip-Erase by vendor specific means.

Some devices provide custom methods for mass erasing the entire flash area and even reset other non-volatile chip state to its default setting.

Errors

May fail if the device is e.g. permanently locked or due to communication issues with the device. Some devices require the probe to be disconnected and re-attached after a successful chip-erase in which case it will return Error::Probe(DebugProbeError::ReAttachRequired)

Implementors

impl DebugEraseSequence for AtSAM